Test configuration
Test setups define the channels, computed channels and DataModes™ that the data processor acquires and processes during a test run. The Test setup page displays the parameters of the current setup configuration.
Select the test setup using the test selector in the header.
To the right of the selector are test indicators.
Diagnostic messages |
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Live updates (Test configuration section only) |
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Edit status |
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TIP
A test setup can never be edited while it is running. To allow tests to be edited while a different test is running, select the Allow editing other setups during test runs option in System preferences.
NOTE
These scenarios can be circumvented in part by zeroing the sensors before starting a test run. However, for test runs automatically restarted on power cycles in particular, consider increasing the start delay time to allow the sensors or signal conditioners to stabilize.
NOTE
There is a known issue with using this option. If the input signal saturates the A/D converter on the negative rail (i.e., has a value of -32768), the inversion on those data samples will fail (because +32768 is out of range for the 16 bit D/A follower that generates the analog output signal).
NOTE
The default live updates settings for new test setups are defined in User preferences.
There are currently three test run modes supported.
There are currently two test stop options supported in the Setup panel view. Note that the Run Stopper computed channel is another option. There are no restrictions on using multiple test stop options in the same test.
Custom column names can be used for a setup's source channel configuration.
The column names can be used for any desired purpose and can contain any desired values. Custom names with a blank value will not show in the single channel editor.
If information is entered in System configuration > Preferences > Setup > User info 1, 2, 3 or 4 a custom column name is automatically filled at the creation of a new Test setup.
See Grid interface for information about showing or hiding columns.
There are several methods to create a test setup.
To permanently delete a setup from the device, select the desired test setup and click Delete. Deleted test setups cannot be recovered.
Click Import. Click Browse to select the test configuration to be imported. Select the file type, either Setup format .sxr or Excel format .xlsx (Excel 2007). The format must be valid json and the syntax valid setup configuration. Click Import.
To save a test setup to the local machine, select the desired setup and click Export.
The setup may be saved as an .sxr text file containing the setup configuration in a json format, or as an .xlsx (Excel 2007) file. Exported setups may be imported to another device as is or after modification. Only one test setup can be exported at a time.
NOTE
The Excel 2007 export/import functionality is currently in a rudimentary state in regard to scope and in regard to user documentation.
The primary reason for this is that it has recently become clear that this Excel interface would be more useful in the SomatXR Emulator application. Because of this we are reevaluating the need / priority to support this in the CX23-R/EXRCPU web browser user interface. For anyone interested in using this interface under these conditions, please note the following.
1) The interface is limited to CX23-R DIO input channels and all MX module channels (excluding CAN channels).
2) The valid values for parameters are the values that the user interface uses and supports (for example, an MX1615B-R “Input mode” could be “Bridge full 6 wire” or “60V”). The user must specify exact strings (including upper- and lower-case letters); if not, the user interface will flag the channel as invalid.
3) If there are too many invalid parameter values found or if any critical parameter value is missing or invalid, the user interface will reject the Excel file import.
4) It is currently recommended that the user export SXR files to generate templates that can be modified and extended (for example, copy a channel row to create a new channel and then assign a new valid connector name to that channel).
5) Exporting a channel defined via TEDS and/or HBM SDB parameter assignment is supported; however the traceability parameters are not currently included in the export (that is, the exported channels will have the proper parameterization, but when reimported, the channel will not show up with an associated TEDS or SDB state icon).