High Speed Data Acquisition Card Allows for Full Flexibility in Dynamic Applications
- Universal card for nine different sensor types
- Suited for dynamic mechanical testing with sample rates of 500 kS/s
- Cost-effective solution: No need to use multiple different data acqui-sition cards due to universal inputs
Darmstadt, November 21, 2016. The new GN840B/1640B Genesis High Speed universal data acquisition card from HBM Test and Measurement (HBM) is suited for dynamic applications in materials and structural testing. These applications include drop and shock as well as impact tests, because it offers 500 kS/s per channel sample rate and 210 kHz bandwidth.
Maximum flexibility is guaranteed through the possibility of connecting nine different sensor types. These include strain gauges in full, half and quarter bridge configuration, IEPE and piezoelectric sensors, thermocouples, RTD (e.g. Pt100) as well as sensors with 4…20 mA or electric voltage output. Several different data acquisition cards are not required, which makes this universal and flexible solution particularly cost-effective.
The universal card supports a “real time math” option that solves virtually any real time mathematical challenge. Since this is an option of the card, the system’s computing power is scalable. In addition, computed results can be output with 1 ms latency to an automated test bench application via EtherCAT.
Data acquisition cards with eight or sixteen channels are available.