This three day seminar provides a complete overview of the HBM eDAQ and eDAQlite hardware along with its TCE setup software. On day one, attendees become familiar with the various hardware layers and their functions as well as proper communication methods. We examine “trouble shooting” techniques to understand how to deal with potential problems that may be encountered in the field.
Although the existing user may be aware of some of the fundamentals of the eDAQ, days two and three are designed to introduce advanced features that many standard users are not aware of. These days cover all aspects of the eDAQ’s functionality with a start-to-finish approach. If attendees are going to use their system for data logging, this seminar will show them how to start taking advantage of the array of tools that are available to them including triggers, digital input/output configuration, calculated channels, data modes, and integrated video. We introduce some of the intricacies of the eDAQ along with the processing capabilities that set it aside from any other system. Tools such as real-time data processing, data reduction by statistical means and cyclic identification will be covered to help the user gain confidence that their test setup is optimized.
Additionally since most of technology involves on-board controller based communication, the attendees will cover the basics of CAN Bus Structure and how it can be implemented using the eDAQ.
Objective: The attendee will become familiar with the eDAQ, the communication methods it uses and key parameters associated with normal operation. They will gain a clear understanding of the eDAQ and its relationship and application to many transducer types. They will acquire insight into some of the “add on” capabilities of the eDAQ, such as GPS and CANbus. They will learn the capabilities of eDAQ beyond the “logger”. And they will become familiar with some of the methods that can be used to control the system. Upon completion, attendees understand why, how and when to use a variety of data collection formats and how they can be successfully applied to a real test environment.