Test configuration
Test setups define the channels, computed channels and DataModes™ that the data processor acquires and processes during a test run. The Test setup page displays the parameters of the current setup configuration.
Select the test setup using the test selector in the header.
To the right of the selector are test indicators.
Diagnostic messages |
|
||||||||||
Live updates (Test configuration section only) |
|
||||||||||
Edit status |
|
TIP
A test setup can never be edited while it is running. To allow tests to be edited while a different test is running, select the Allow editing other setups during test runs option in System preferences.
NOTE
These scenarios can be circumvented in part by zeroing the sensors before starting a test run. However, for test runs automatically restarted on power cycles in particular, consider increasing the start delay time to allow the sensors or signal conditioners to stabilize.
NOTE
There is a known issue with using this option. If the input signal saturates the A/D converter on the negative rail (i.e., has a value of -32768), the inversion on those data samples will fail (because +32768 is out of range for the 16 bit D/A follower that generates the analog output signal).
NOTE
Currently, channels that have experimental scaling cannot be calibrated using this dialog window; to calibrate these channels, the Shunt scaling and/or the Two point scaling task(s) must be used.
NOTE
The default live updates settings for new test setups are defined in User preferences.
There are currently three test run modes supported.
There are currently two test stop options supported in the Setup panel view. Note that the Run Stopper computed channel is another option. There are no restrictions on using multiple test stop options in the same test.
Custom column names can be used for a setup's source channel configuration.
The column names can be used for any desired purpose and can contain any desired values. Custom names with a blank value will not show in the single channel editor.
If information is entered in System configuration > Preferences > Setup > User info 1, 2, 3 or 4 a custom column name is automatically filled at the creation of a new Test setup.
Custom column name type
For the Type, select Text or Numeric for sorting channel rows. Text is the default and will allow sorting of rows by the text string entered for the Custom column name. Numeric may be selected and will allow sorting of the rows numerically by the content entered for the Custom column name.
In Numeric sorting, strings that are not numbers are ignored in the sorting algorithm, and will be displayed at the top or bottom of the list in an arbitrary order.
Numeric content is simple number strings, such as positive or negative integers and decimals. Fractions, roots and other mathematical symbols, such as an equation, are not supported and will be sorted to the top or bottom of the list in an arbitrary order.
See Grid interface for information about showing or hiding columns.
There are several methods to create a test setup.
To permanently delete a setup from the device, select the desired test setup and click Delete. Deleted test setups cannot be recovered.
Click Import. Click Browse to select the test configuration to be imported. The file type is the Setup format .sxr. The format must be valid json and the syntax valid setup configuration. Click Import.
To save a test setup to the local machine, select the desired setup and click Export.
The setup may be saved as an .sxr text file containing the setup configuration in a json format. Exported setups may be imported to another device as is or after modification. Only one test setup can be exported at a time.