Test configuration
Test setup
Test setups define the channels, computed channels and DataModes™ that the data processor acquires and processes during a test run. The Test setup page displays the parameters of the current setup configuration.

Select the test setup using the test selector in the header.
To the right of the selector are test indicators.
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Live updates (Test configuration and Test control sections only) |
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- Setup name: The setup name must be unique and contain valid characters (invalid characters are single and double quotes, tab, '\', '/', '|' and ',').
- Title: Enter an optional title of the test setup.
- Author: Enter an optional author of the test setup. The author defaults to the logged in user.
- Summary: Enter an optional detailed summary of the test setup.
- Test start delay: Specify the test start delay time in seconds. The default value of zero is the recommended setting in general. Non-zero delay times may be desired in the following scenarios.
- Some sensors such as IEPE sensors require significant time to stabilize after excitation is applied.
- For some sensor configurations, MX modules can start sending data before the signal conditioner circuitry is fully stabilized causing data to be tagged as "overflow data".
NOTE
These scenarios can be circumvented in part by zeroing the sensors before
starting a test run. However, for test runs automatically restarted on power
cycles in particular, consider increasing the start delay time to allow the sensors or signal conditioners to stabilize.
- Sample rate domain: The sample rate domain is read-only and based on the System preferences when the test setup is created. The sample rate domain cannot be changed once the setup is created.
- Test engine frame rate: The factory default value of 20 S/s (Decimal domain) is recommended for testing applications where the sample rates are relatively low and digital output rates of 20 S/s is acceptable. Take the following into account when setting the test engine frame rate.
- Digital output channels are always updated at the test engine frame rate.
- The latency of the real time displays is a function of the test engine frame rate. For example, at 5 Hz, the latency is at least 0.2 seconds; at 20 Hz, the latency is at least 0.05 seconds.
- In general, increasing the test engine frame rate minimally increases the CPU load. For example, a channel sampled at 100 Hz is more efficient to process using five frames of 20 data samples compared to using 20 frames of five data samples. However, this is not critically important unless the test is running at high CPU load (i.e., 80% or higher).
- If the 100 Hz frame rate is used, the system can error reset if the test has all 16 channels on any EBRG or EHLS layer defined to use the 100 S/s Linear Phase 33 Hz sample rate / digital filter setting. The likelihood of seeing this error increases significantly when Smart Modules are used on the EHLS layer.
- Invert the analog output signals of all channels that have a negative "sensor scaling slope": When the "sensor scaling slope" (in terms of the relation between A/D units and Physical units) is negative on any channel sourced from the EBRG and EHLS layers, the analog output signals will have inverted polarity relative to the channel data that the users will see in the data displays and what ends up in the SIE file. This is problematic for some users in some usage cases. To deal with this, we provide the option to invert the analog output signals of all channels that have a negative "sensor scaling slope."
NOTE
To be compatible with the TCE/eDAQ support for this option, the AOX file is not changed when this option is used. As such, the user is responsible for changing the sign of the Physical units value calculated from the Scale and Offset parameters in the AOX file.
NOTE
There is a known issue with using this option. If the input signal saturates the A/D converter on the negative rail (i.e., has a value of -32768), the inversion on those data samples will fail (because +32768 is out of range for the 16 bit D/A follower that generates the analog output signal).
- SIE Filename pattern default: Select between Numeric increment or Date and time suffix for automatic naming of SIE files. For FTP uploads, if the filename mode is Date and time suffix, the extra timestamp normally put on the end of the FTP destination filename is omitted.
- Minimize SIE file sizes using integer data types: Use this preference to enable the option to reduce SIE file sizes whenever a new SXR test setup is created. See System preferences> Test > Minimize SIE file sizes using integer data types for more information.
- Collect storage mode options: There are two options available.
- Collect default value: Check this box to set the Collect channel parameter value to TRUE whenever any new channel is added to the setup. This is the default setting. Uncheck this box to set the Collect channel parameter value to FALSE whenever any new channel is added to the setup.
- Collect DataMode name: Optionally, specify a DataMode name to be associated with all channels that are stored in the SIE file using the Collect channel parameter. If a name is specified, it must be a valid and unique DataMode name. This is useful for sorting SIE channels by DataMode name in post processing applications
- Use channel calibration dates and locks: False shows when a new Test setup does not have channel calibration dates and locks enabled. True shows when a new Test setup has channel calibration dates and locks enabled. In the Input channels task pane, click the Calibration options... button. A dialog window is presented with the options available for calibrating channels or unlocking (removing) the calibration parameters so they can be edited.
NOTE
Currently, channels that have experimental scaling cannot be calibrated using this dialog window; to calibrate these channels, the Shunt scaling and/or the Two point scaling task(s) must be used.
- Network mode: Select Mode 1 or Mode 2.
For Mode 1, one eDAQXR/eDAQXR-lite serves as the networked system host (the master node), and all other connected eDAQXR/eDAQXR-lite units (the slave nodes) provide source data to the master node. Only one SIE file is generated on the master node.
For Mode 2, every node runs a test engine and generates an SIE file. This mode will typically only be used when Mode 1 cannot be used due to CPU processing limitations on the master node, or when there is insufficient SIE file storage space on the master node.

There are currently three test run modes supported.
- Normal: In this mode, test runs can only be started and stopped.
- Cyclic: In this mode, tests are automatically started after a test run is stopped under program control (e.g., using the Test duration option or using a Run Stopper computed channel). The user can specify a fixed number of test run cycles or specify that there is no limit to the number of test run cycles. See Cyclic test run mode for more information.
- Remote Control: In this mode, tests can be started and stopped using a remote switch connected to a designated port on the CX23-R/EXRCPU/EXRLCPU. See Remote control run mode for more information.

There are currently two test stop options supported in the Setup panel view. Note that the Run Stopper computed channel is another option. There are no restrictions on using multiple test stop options in the same test.
- Stop on test duration: Select the check box. Set days, 0 to 365. Set hours, 0 to 23. Set minutes, 0 to 59. Set seconds, 0 to 59. The minimum test duration time is 5 seconds. If a test in interrupted by a power cycle or other event that results in a reboot, the test run automatically started on reboot will run for the full specified test duration. This option is available for all Test run modes.
- Stop test at: Select the check box. When using test stop on date/time or test stop on time of day, the test may stop a little before or a little after the requested time. There are usage modes available.
- Set both the UTC time of day and date. In this mode, the test run will stop shortly (i.e., typically within one second) after the specified date and time is reached. Note that this mode is not available if the Test run mode is Cyclic or Remote control.
- Set both the UTC time of day only. In this mode, the test run will stop shortly after the specified time of day is reached. Note that this mode is not available if the Test run mode is Remote control.

Custom column names can be used for a setup's source channel configuration.
The column names can be used for any desired purpose and can contain any desired values. Custom names with a blank value will not show in the single channel editor.
If information is entered in System configuration > Preferences > Setup > User info 1, 2, 3 or 4 a custom column name is automatically filled at the creation of a new Test setup.
Custom column name type
For the Type, select Text or Numeric for sorting channel rows. Text is the default and will allow sorting of rows by the text string entered for the Custom column name. Numeric may be selected and will allow sorting of the rows numerically by the content entered for the Custom column name.
In Numeric sorting, strings that are not numbers are ignored in the sorting algorithm, and will be displayed at the top or bottom of the list in an arbitrary order.
Numeric content is simple number strings, such as positive or negative integers and decimals. Fractions, roots and other mathematical symbols, such as an equation, are not supported and will be sorted to the top or bottom of the list in an arbitrary order.
See Grid interface for information about showing or hiding columns.

Select the maximum number and minimum timing for notifications sent for the Over range detector channel. See Notifications for configuring email and HBM Push notifications to be sent from the system. While setting up an Over range detector channel, select the Enable notifications checkbox to apply notification controls during a test run.
- Max notifications per test run: Select the desired number in the range of one (1) to 50.
- Min time (seconds) between notifications: Select a time period in the range of 30 to 120 seconds.
- Max over ranges reported per notification: 50 is the limit and cannot be changed.

NOTE
The default live updates settings for new test setups are defined in User preferences.
- Live updates refresh rate: Specify the rate that live data refreshes on the hardware and input channel pages when live updates are running.
- Live updates always on: Select this option to automatically start live updates when the test setup is saved. Live updates can be stopped and started manually at any time when a test is not running. If not selected, live updates must be started manually.
- Include resampled message channels: Select this option to show live updates for resampled channels such as CAN, GPS and system channels.
- Include computed channels: Select this option to show live updates for computed channels.

There are several methods to create a test setup.
- Click
New to create a new test setup with default values. The new setup appears in the setups drop down list as test_name.
- Select an existing test setup and click
Save As... to duplicate the setup under a new name. It is not possible to replace an existing setup.
- Click
Import. Click Browse to select the test configuration to be imported. The file type is the Setup format .sxr. The format must be valid JSON and the syntax valid setup configuration. Click Import. See additional information in Importing or exporting a test setup below.

To permanently delete a setup from the device, select the desired test setup and click Delete. Deleted test setups cannot be recovered.

Click Import. Click Browse to select the test configuration to be imported. The file type is the Setup format .sxr. The format must be valid JSON and the syntax valid setup configuration. Click Import.
To save a test setup to the local machine, select the desired setup and click Export. Exported setups can be imported on another device. Only one test setup can be exported at a time.