Only one module needed to measure all mechanical quantities
QuantumX MX1615B: Suitable strain gauge bridge amplifier for experimental stress analysis
The MX1615B strain gauge bridge amplifier is perfect for stress analysis, enabling connections of up to 16 sensors or strain gauges in full-, half-, or quarter-bridge configurations. Only one module is required to measure all mechanical quantities.
The MX1615B bridge amplifier offers unrivaled channel density and supports full integration into the modular data acquisition system. All channels support TEDS, or Transducer Electronic Data Sheet, which offers a plug and play capability with analog sensors. A TEDS module speeds the system configuration process by having the individual characteristics of the sensor, including sensitivity, nominal (rated) force, supply voltage, serial number and transducer type saved to memory when the sensor is delivered.
They also have been designed for compatibility with ±10V voltage signals and Pt100 temperature sensor connections. It further distinguishes itself with its 4-, 5-, and 6-wire circuit-based patented technology, employing carrier frequency methods and cyclical auto-adjustment on all channels.
All these features make the amplifier rugged and insensitive to electromagnetic and thermal interference from converters, high currents, electric motors, or temperature effects. The amplifier also can support applications involving distant measurement sites. Ethernet TCP/IP allows integration of the MX1615B close to the measurement point to obtain the shortest possible sensor lines. The amplifier is ideally suited for applications in experimental stress analysis:
- Static load tests for the verification of FEM models
- Quasi-dynamic fatigue tests for durability analyses
- Monitoring tasks when combined with the QuantumX CX22B-W data recorder
- Material testing and residual stress analysis
- Road Load Data Acquisition (RLDA)
|Naam / Omschrijving||Taal||Producten||Taal||Document soort|
|QuantumX MX1615B - Data Sheet||English|
|QuantumX MX1615B - Data Sheet||Japanese|
|QuantumX MX1615B - Data Sheet||Chinese|
|QuantumX MX1615B - Datenblatt||German|
|QuantumX - Brochure||English|
|QuantumX - Brochure (US-Version)||English (US)|
|QuantumX - Brochure||Simplified Chinese|
|QuantumX - Brochure||Japanese|
|QuantumX - Broschüre||German|
|QuantumX - Folheto||Portuguese|
|HBM Common API - User Manual||Meerdere talen|
|HBM LabVIEW Driver - User Manual||Meerdere talen|
|QuantumX - Bedienungsanleitung||German|
|QuantumX - Manuale di istruzione||Italian|
|QuantumX - Operating Manual||English|
|QuantumX - Operating Manual (Japanese)||Japanese|
|QuantumX - Operating Manual||Chinese|
|QuantumX CANape Driver - Operating Manual||English, German|
|QuantumX CANbus - Operating Manual||English, German|
|QuantumX CX22B / CX22B-W - Operating Manual||German, English|
|QuantumX CX27 Gateway - Operating Manual||English|
|QuantumX Driver per CANape - Manuale di istruzione||Italian|
|Mechanical mounting case clips (CASECLIP)||Italian|
|QuantumX - Mounting case clips||English|
|QuantumX BPX001/BPX002 Backplane - Information||German, English|
|QuantumX Portamoduli BPX001 - Informativa||Italian|
|EU Declaration of Conformity|
|QuantumX - EU Declaration of Conformity||Meerdere talen|
TECH NOTE - Analog to Digital Data Path in QuantumX Modules
This TECH NOTE describes in general the digitalization path in QuantumX data acquisition modules, explaining anti-aliasing filter, analog to digital conversion, digital filtering, scaling, datarate and distribution of data within the data acquisition system or to a data sink whether this is a storage medium or gateway.
TECH NOTE - IEEE1588:2008 PTPv2-Switches and Grandmaster Clocks
This TECH NOTE shows available and tested PTP components together with HBM equipment and can be used as reference source giving you some recommendations.
TECH NOTE - IEEE1588:2008 Precision Time Protocol in Data Acquisition and Testing
This TECH NOTE explains the highly accurate time sync mechanism Precision Time Protocol or short PTP, its advantages and its use in Test & Measurement applications.