선형성 및 감도 오류 선형성 및 감도 오류 | HBM

피로 시험 분석의 중요한 부분인 싱글 스트레인 게이지와 회로 타입에 따라 계측 라이너리티 및 감도에 영향을 줍니다.

This article describes the basic principles of strain measurement by means of strain gages, from the strain itself via the variation in resistance to the eventual electrical signal, and compares the magnitude of error of the voltage-fed bridge circuit and the current-fed circuit.

The conclusion reached is that, for single strain gages, voltage-fed bridge circuits give better linearity by several powers of ten and, when there is initial detuning, a similarly more stable sensitivity than current-fed circuits.