Input Card for Universal Tests: 500 kS/s – GN840B, GN1640B
The universal data acquisition card supports 9 different sensor types on every input and is perfectly suited for dynamic mechanical testing.
Due to its high sample rate of 500 kS/s per channel and 24-bit resolution, it is the perfect solution for all kinds of mechanical testing such as shock and vibration as well as impact testing. The fast input card offers many advantages: it provides 8 or 16 channels enabling you to implement cost-effective solutions.
- Universal inputs
- 9 different sensor types
- Individual type for every channel
- Sample rates from 0.1 S/s to 500 kS/s per channel
- Optimal anti-aliasing
- User-selectable IIR filters
- Real-time formula database for true real-time math routines
- Recording triggered by results
- Results stream to EtherCAT
Complete Package for Dynamic Material Tests
The HSM1C840 and HSM1C1640 packages are perfect for measuring dynamic mechanical quantities. Connect up to 16 strain gauges or other sensors.
Genesis HighSpeed - DAQ for Highest sample rates
The HBM Genesis HighSpeed transient recorder and data acquisition systems (DAQ) are ideal for highest sample rates (from 20 kS/s to 250 MS/s per channel)
Genesis HighSpeed Tethered Mainframes
Genesis Highspeed “tethered” mainframes are to be used stand-alone or with a PC connected via Ethernet. They are the first choice for fixed installations.
Shock, Vibration and Impact Testing
Genesis High Speed DAQ system provides absolute data security, plus an extremely high sample rate of up to 100 MS/s for shock, vibration and impact tests.